Posted on: 29/04/2026
Key Skills : Scan Insertion, ATPG, DFT Design, MBIST, JTAG
Roles and Responsibilities :
- Implement and verify DFT methodologies for HBM, DDR, and SerDes IP designs.
- Perform scan insertion, ATPG generation, and DFT architecture validation to achieve high test coverage.
- Collaborate with design and architecture teams to define and optimize testability requirements.
- Work closely with STA and design implementation teams to ensure design closure for test.
- Generate, verify, and debug test vectors prior to tape-out.
- Validate and debug test vectors on ATE during silicon bring-up.
- Support silicon failure analysis, diagnostics, and yield improvement initiatives.
- Interface with customers, physical design, and manufacturing/test engineering teams globally.
- Debug customer-returned parts using ATE platforms.
- Develop automation scripts to streamline DFT and test vector generation flows.
- Document verification methodologies, results, and best practices to enhance team efficiency.
- Innovate and implement advanced DFT solutions for next-generation nodes including 3nm and beyond.
Skills Required :
- Strong hands-on experience in DFT design and verification methodologies.
- Expertise in scan insertion and ATPG for high-coverage test generation.
- Experience implementing MBIST architectures and memory test strategies.
- Knowledge of JTAG and boundary scan standards.
- Experience working with high-speed IPs such as HBM, DDR, and SerDes.
- Understanding of silicon bring-up, ATE validation, and yield analysis processes.
- Familiarity with deep submicron technologies and advanced node challenges.
- Proficiency in scripting for automation of DFT and test flows.
- Strong analytical and debugging skills in semiconductor environments.
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Posted in
Semiconductor/VLSI/EDA
Functional Area
Embedded / Kernel Development
Job Code
1632196