Job Description:

- The candidate is expected to have a clear understanding of B SCAN, MBIST, SCAN, ATPG and Simulation concepts.

- Should have experience in at least one: MBIST insertion, Scan Insertion, ATPG pattern generation and simulations, MBIST and BSCAN simulations using industry standard tools of Cadence/Siemens Tessent/Synopsys.

- Good to have worked on zero delay as well as SDF Timing Simulations.

- Should have good debugging skills using GUI mode of industry standard simulators like VCS, NCSim or Xcelium.

- Good to have worked on fault models like stuck-at, Transition Delay Faults (TDF), IDDQ and should have experience in scan test coverage improvement techniques.

- Candidate should have worked in SoC level DFT with experience in OCC/OPCG insertion, EDT/Compression logic insertion, clock module handling for scan purposes and post-silicon bring-up and/or production activities with exposure to Tester debug using shmoo plots and graphs.

- The candidate should have experience of providing test mode timing constraints to STA and PD teams.

- Good communication skills and debugging skills are a must to have qualities for this role as it involves cross-functional teams and customer teams communications along with internal DFT team leading and mentoring of DFT Engineers.